OREGA, A.; MWAMBURI, M.; MAGHANGA, C. Development of an Automated Hall Effect Experimentation Method for the Electrical Characterization of Thin Films. Journal of Information, Technology and Data Science, [S. l.], v. 7, n. 1, p. 58–68, 2023. DOI: 10.53819/81018102t4208. Disponível em: https://stratfordjournalpublishers.org/journals/index.php/Journal-of-Information-and-Techn/article/view/1850. Acesso em: 8 mar. 2026.